Optical Profilometer - Keyence VK-X3100
Optical Profilometer - Surface Topography on Nanometer Scale
UNF Devices & Tools
Memmert Oven
Gas Tight Oven
Ion Milling System
Ion Beam Milling processes and preparations for future ion beam sputtering
Alignment Station
High resolution, high speed e-beam lithography down to nanometers
Vacuum Oven
Vacuum Drying Oven
UHV Sputtering System
UHV Sputtering Layer Deposition
Alexander Oginets | 02-6585249 | alexandero@savion.huji.ac.il
Sputtering System
Sputtering Layer Deposition
Programmable Hot Plate
Hot Plate for Photolithography Purposes
Probe Station
For reservation please contact:
Dr. Ilya Goykhman ilya.goykhman@mail.huji.ac.il
Inspection Microscope Olympus
Optical Microscope
Ellipsometer
Characterization of Transparent Layers
Layer Thickness and Refractive Index
ICP/RIE System
ICP/RIE System
PECVD System
PECVD System
VST Metals Evaporator
Physical Vapor Deposition (PVD)