Probe Station
Electric Characterization of Samples
Alexander Oginets | 02-6585249 | alexandero@savion.huji.ac.il
Characterization
Ellipsometer
Characterization of Transparent Layers
Layer Thickness and Refractive Index
Mechanical Profilometer
Profile Scanning of Surfaces
Dr. Itzik Shweky | 02-6586127 | Itzhak.shweky@mail.huji.ac.il
Hall Effect Measurement System
Characterization system to measure density of carriers, mobility, resistivity and type of semiconductor
Optical Profilometer
Optical Profilometer - Surface Topography on Nanometer Scale