Optical Profilometer - Keyence VK-X3100
Optical Profilometer - Surface Topography on Nanometer Scale
Characterization
Probe Station
For reservation please contact:
Dr. Ilya Goykhman ilya.goykhman@mail.huji.ac.il
Ellipsometer
Characterization of Transparent Layers
Layer Thickness and Refractive Index
Mechanical Profilometer - Dektak 150
Profile Scanning of Surfaces
Dr. Itzik Shweky | 02-6586127 | Itzhak.shweky@mail.huji.ac.il
Hall Effect Measurement System
Characterization system to measure density of carriers, mobility, resistivity and type of semiconductor
Optical Profilometer - Bruker Countour GT-K1
Optical Profilometer - Surface Topography on Nanometer Scale