back to UNF devices & tools >>
Manufacturer and model:
Hall Effect Measurement System LakeShore 8400 Series
General Information:
Characterization system to measure density of carriers, mobility, resistivity and type of semiconductor
Key Features:
- DC Magnetic Fields up to 1.7 T
- measurement at room temperature
- measurement at liquid Nitrogen temperature
- measurement of high resistivity samples
- Programable measurement versus Field, Time and Temperature
- Room temp measurement on dark or under illumination
- samples up to 10mm x 10mm
Applications:
Characterization of standart semiconductors such as Si, GaAs, InP, Ge and also more exotic materials like complex alloys, photo-voltaics, metals
Materials:
Si, GaAs, InP, Metals, Alloys, PV
Start of Operation Date:
January 2017