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HOME / LINKS / CHARACTERIZATION / Ellipsometer

Ellipsometer

Characterization of Transparent Layers
Layer Thickness and Refractive Index

Dr. Itzik Shweky | 02-6586127 | Itzhak.shweky@mail.huji.ac.il

https://nano.huji.ac.il/ellipsometer

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The Hebrew University of Jerusalem
The Harvey M. Krueger Family Center
for Nanoscience and Nanotechnology
Edmond J. Safra Campus
Jerusalem 9190401, Israel

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