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Manufacturer and model:
Optical Profilometer Countour GT-K1, Bruker
General Information:
Surface Topography on Nanometer Scale
Key Features:
- Resolution on Z scale: 1nm
- Z scan Range: up to 10mm
- Installed Objectives: x5, x10, x20 and x50
- Additional Optical Magnification: x0.5, x1 and x2
- 150mm Motorized Stage
- Three illumination Sources: White, Green and Short Green
- Automation, Filters, Data management
Applications:
Measurement of complex topographies on different samples ranging from standard wafers and chips to rocks, teeth, plants, fruits, moving parts, etc
Materials:
Any surface that is reflective enough to the used illumination wavelength
Start of Operation Date:
June 2011