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Manufacturer and model:
Scanning Transmission Electron Microscope Tecnai F20 G2 STWIN (ThermoFisher, former FEI)
General Information:
High resolution analytical (S)TEM Tecnai F20 meets the wide range of demands in materials research on the morphology, crystallography, elemental and chemical compositions as well as the electronic structure of defects, interfaces, surfaces, grain boundaries, boundary segregates and phases presenting in metals, ceramics, semiconductors, multi-layers, fine grained catalysts, composite materials and polymers. The instrument combines an atomic resolution imaging in TEM and STEM modes with extended analytical abilities including Energy Dispersive XRay Spectroscopy (EDS) and Electron Energy Loss Spectroscopy (EELS) for local elemental analysis and chemical imaging.
Key Features:
(S)TEM Tecnai F20 uses Schottky type FEG electron source and is operated at 200 kV. It provides TEM imaging at the resolution of 0.20 nm and STEM imaging at the resolution betterm. It than 0.2 nis equipped with the bottom mounted 1K GATAN Multiscan 794 CCD camera. The CompuStage goniometer allows tilt range of +/- 40 deg. It is equipped with the EDAX TSL detector for (EDS, spectral resolution133 eV) and Gatan Imaging Filter for Electron Energy Loss Spectroscopy (EELS, energy resolution < 0.8 eV) and Energy Filtered imaging (EF TEM) and High Angular Annular Dark Field Detector (HAADF) for high resolution STEM Z-contrast imaging.
Tecnai F20 has a few holders to be used for different types of analysis: the single and double-tilt low background holders to be used simultaneously with EDS; the regular single tilt holder and the tilt-rotation holder for crystallography. In 2008 the instrument was upgraded with the platform for automated TEM tomography analysis which includes also a Fischione single tilt holder to tomography acquisition at +/- 60 deg angle range.
Start of Operation Date:
December 2002