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Manufacturer and model:
Scanning Transmission Electron Microscope Talos F200i
General Information:
In high-resolution STEM and TEM imaging with Energy Dispersive Talos™ F200i is a fully digital microscope, flexible, and compact 200 kV FEG Scanning Transmission Electron Microscope (S/TEM), which is designed for fast, precise and quantitative characterization of nano-materials. It enables nano-analysis of materials based on high data quality, fast acquisition, and simplified, easy and automated operation. It combines outstanding quality X-ray Spectroscopy (EDS)
Key Features:
The major configuration of our Talos F200i includes an ultra-high-brightness cold field emission electron source (X-CFEG), a ConstantPower™ lens design for ultimate thermal stability, an automated apertures, a computerized 5-axis specimen piezo-stage, a comprehensive set of STEM detectors ( HAADF + Panther on-axis DF/BF detectors); the CETA-S 16M CMOS camera; the high collection efficiency Dual-XFlash6 EDS system , and the NanoEx™–i/v Single-Tilt TEM Holder for in situ experiments.
Start of Operation Date:
November 2024