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Manufacturer and model:
Extra-High Resolution Scanning Electron Microscope Magellan 400L (ThermoFisher, former FEI)
General Information:
XHR SEM Magellan offers accurate imaging with sub-nanometer resolution from 1 to 30 kV energy range. It provides the excellent contrast needed for precise measurements on materials in a variety of applications including novel materials, such as catalyst particles, nanotubes, porosities, interfaces, biological objects, and other nanoscale structures. High-resolution, high-contrast images are obtained without compromising the high throughput, analytical capabilities, sample flexibility, and ease of a traditional SEM.
Key Features:
XHR SEM Magellan is equipped the monochromated Schottky-type FEG and a comprehensive set of electron detectors for scanning and scanning transmission electron microscopy. With a beam decelerator the landing energy of scanning electrons could be decreased down to 50 eV. A local elemental analysis and imaging is available with the EDS (energy dispersive X-Ray spectroscopy) via a large area Oxford XMAX Silicon drift detector working under INCA Energy 450 platform. The automated load lock allows to exchange the sample within 100 sec. The CryoCan and the in situ Plasma Cleaner provide contamination-free imaging at the lowest landing energies.
Start of Operation Date:
January 2010