Dr. Inna Popov

Head of Unit for Nano Characterization, The Hebrew University Center for Nano Science and Nano Technology

In my talk, I present the imaging and analytical capabilities of the new high-resolution scanning-electron microscope (HR STEM) Talos F200i recently installed at the Unit for Nanocharacterization. 
Based on the data acquired at the samples belonging to HUJI research community I will illustrate the specifications of the new microscope and its new abilities as compared to the Tecnai F20 we used for the last 20 years.