Dr. Vitali Gutkin
XPS Laboratory, Center for Nano Science and Nano Technology, The Hebrew University of Jerusalem
X-ray Photoelectron Spectroscopy (XPS) is widely used surface analyses technique for characterization, which provides unique information about materials: quantitative chemical analyses of ultra-thin films or surfaces – from less than 1 nm down to 10 nm of material thickness and chemical state and atomic functional bounds of the elements.
This characterization is widely used for many diverse applications including: polymers, metals, catalytic materials, thin film devices, powders, coatings, nanoparticles and nanomaterials, semiconductor devices, minerals, biological, medical and pharmaceutics applications and others.
From the installation in 2003, the XPS at the Hebrew University Center for Nanoscience and Nanotechnology worked nonstop and served many of research groups at the University, form other academic institution in Israel and abroad and for industry. Currently, the XPS served about 100 research groups, which comes from chemistry, physics, agriculture, life sciences, medicine, school of pharmacy, earth sciences and other academic institutions and companies.
The new state-of-the-art XPS AXIS Supra by KRATOS Analytical Instruments (UK), installed in 2019, replacer the existed KRATOS AXIS Ultra (installed at 2003).
The instrument applications include:
• Monochromatic Al Ka X-ray source and Ag La X-ray source
• Large area 500 µm to small spot down to 15 µm
• Charge compensation for non-conductive samples
• XPS chemical imaging
• Heating up to +800°C & Cooling down to -100°C
• Monoatomic Ar+ and Gas Cluster Ion Gun Sputtering & Depth Profiling
• Air sensitive sample transporter
• UPS