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Manufacturer and model:
Dimension Icon XR Scanning Probe Microscope (Bruker)
General Information:
Dimension Icon XR (Extreme Research System) is new unique AFM system that combines the highest performance and a wide range of AFM capabilities. Configuration of Dimension XR Nanomechanics with FastScan Tapping AFM provides the complete set of capabilities necessary to characterize quantitatively mechanical properties of wide range of materials (ranging from soft sticky hydrogels to stiff metals and ceramics ) at the nanoscale.
Key Features:
Our new Dimension Icon XR SPM allows the widest range of imaging mode. In addition to the traditional Contact and Tapping imaging modes the system offers the package of new techniques including ScanAsyst, PeakForce Tapping, HarmoniX and Data Cube for topographic, nanomechanical and nanoelectrical applications. The instrument allows local measurements of a wide variety of physical properties via the following special forms of AMF modes: Lateral Force Microscopy (LFM); ScanAsyst; Nanomechanical Mapping (Peak Force QNM™); Magnetic Force Microscopy (MFM); Electric Force Microscopy (EFM); Surface Potential Microscopy; Force Modulation Microscopy; Force Volume; Force Spectroscopy; Fluid Imaging; Fast Tapping; DataCube Nanoelectrical measurements; Nanoindentation and Torsional Resonance Mode (TR Mode)
Start of Operation Date:
January 2020