Aberration Probe-Corrected Scanning Transmission Electron Microscope Themis

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Manufacturer and model:

Aberration Probe-Corrected Scanning Transmission Electron Microscope Themis Z G3 (ThermoFisher, former FEI)

General Information:

Themis Z is state-of-the-art scanning-transmission electron microscope (STEM) providing ultra- high resolution imaging and analytical information down to atom-scale level. Due to its advanced optical design Themis Z delivers a unique analytical platform for low damage and highly sensitive characterization of widest range of materials in 2D, 3D and 4D. Themis Z meets the most stringent characterization demands possessed by today's fundamental and applied research: atomic resolution chemical mapping with various types of signals, high energy resolution spectroscopy, analysis of ultrathin layers and small atom clusters, etc. 

Key Features:

The major configuration of our Themis Z includes a monochromated high-brightness Schottky X-FEG electron source, new generation corrector of spherical aberration for an electron probe, three lens condenser system (ConstantPower™ lens design for ultimate thermal stability) , automated apertures, computerized 5-axis specimen piezo-stage ; a comprehensive set of STEM detectors ( HAADF detector+ on-axis triple DF1/DF2/BF detectors); CETA 16M CMOS camera; high-sensitivity windowless Energy Dispersive X-Ray Spectroscopy (EDS) detector system Super-X and GATAN Enfinium ER977 spectrometer for Electron Energy Loss Spectroscopy (EELS). The instrument allows acquisition of tomographic series in TEM and STEM modes. 


Start of Operation Date:

October 2018